Probing graphene defects and estimating graphene quality with optical …
| 2014-01-27 | |
| S. Lai, S.K. Jang, Y.J. Song, Sungjoo Lee | |
| Applied Physics Letters | |
| 3.302 | |
관련링크
본문
Volume 104, Issue 4, p. 43101, 2014
https://aip.scitation.org/doi/full/10.1063/1.4863080
https://aip.scitation.org/doi/full/10.1063/1.4863080