성균관대학교 이성주교수 연구실 (NDTL, Nanoscale Devices Technology Lab.) 

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Enhanced Sensitivity of Small Size (with 1um Gate Length) Junction-Fie…

2009-12-04
J. Wang, H. Zang, M. B. Yu, Y. Z. Xiong, G. Q. Lo, D. L. Kwong, and Sungjoo Lee
IEEE Electron Device Letters
2.605

본문

Volume 30, Issue 10, p.1066, 2009