Enhanced Sensitivity of Small Size (with 1um Gate Length) Junction-Fie… Date 2009-12-04 Author J. Wang, H. Zang, M. B. Yu, Y. Z. Xiong, G. Q. Lo, D. L. Kwong, and Sungjoo Lee Journal IEEE Electron Device Letters Impact Factor 2.605 DOI 관련링크 본문 Volume 30, Issue 10, p.1066, 2009 이전글 다음글 목록